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In August, the USPTO and American Intellectual Property Law Association will co-host a series of cross-country roadshows with stops in Santa Clara, California; Dallas, Texas; and Alexandria, Virginia. The full-day program will focus on enhancing patent quality (morning session) and conducting AIA trials (afternoon session) with numerous speakers from the USPTO as well as private practice.

Sorry folks, this one won’t be a freebie- but lunch is included!. The price for non-AIPLA members is $375 and the price for AIPLA members is $225. Government and student members can attend for drastically reduced fees- see registration info for more details.

Thus far, it looks like most of the sessions will focus on patent application drafting best practices and proceedings before the Patent Trail and Appeal Board in light of recent rule changes and the America Invents Act (AIA).  Tentative detailed program is here.

Continuing Legal Education credits are available. For further info and to register, go to AIPLA website here.

Planned Schedule:

Monday, August 24, 2015

  • Santa Clara University, Locatelli Center
  • Co-sponsored by the High Tech Institute of Santa Clara

Wednesday, August 26, 2015

  • Belo Mansion, Dallas
  • Co-sponsored by the IP Section of the Dallas Bar Association

Friday, August 28, 2015

  • USPTO headquarters, Madison Auditorium

Agenda

Time
(Local Time)
Topic
9 to 9:10 am Opening Remarks
9:10 to 9:45 am Track 1: Patent Quality Initiative Overview
9:45 to 10:45 am Track 2: Clarity of the Record and Drafting High Quality Applications
10:45 to 11 am BREAK
11 to Noon Track 3: Interviews and Measuring Quality
Noon to 1:30 pm LUNCH-Luncheon Speaker: Russell Slifer, Deputy Director of the USPTO
1:30 to 1:50 pm Track 4: PTAB State of the Board
1:50 to 2:45 pm Track 5: Proposed AIA Trial Rule Changes
2:45 to 3:30 pm Track 6: Hot Issues in AIA Trials
3:30 to 4 pm BREAK
4 to 5 pm Track 7: Actual AIA Trial Hearing

Speakers Include:

USPTO

  • Valencia Martin Wallace, Deputy Commissioner of Patent Quality
  • Sandie Spyrou, Senior Quality Assurance Specialist in the Office of Patent Quality Management
  • Bob Bahr, Senior Patent Counsel in the Office of the Deputy Commissioner for Patent Examination Policy
  • Tim Callahan, Director of Technology Center 2400
  • Marty Rater, Chief Statistician in the Office of Patent Quality Assurance
  • Vice Chief Judge Scott Boalick
  • Lead Judge Susan Mitchell
  • Judge Peter Chen
  • Judge Miriam Quinn
  • Judge Linda Horner
  • Lead Judge Matt Clements
  • Judge Tina Hulse
  • Judge Stacey White
  • Judge Georgianna Braden
  • Lead Judge Mike Tierney
  • Judge Sally Medley

Practitioners

  • Tom Irving, Finnegan Henderson
  • Courtenay Brinckerhoff, Foley Lardner
  • Ken Nigon, RatnerPrestia
  • Professor Collen Chien, Santa Clara Law School
  • Brad Pederson, Patterson Thuente
  • Erika Arner, Finnegan Henderson
  • Sharon Israel, Mayer Brown
  • David McCombs, Haynes and Boone
  • Todd Baker, Oblon
  • Dorothy Whelan, Fish & Richardson
  • William Noon, Illumina

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